International Journal of Circuits, Systems and Signal Processing

   
E-ISSN: 1998-4464
Volume 15, 2021

Notice: As of 2014 and for the forthcoming years, the publication frequency/periodicity of NAUN Journals is adapted to the 'continuously updated' model. What this means is that instead of being separated into issues, new papers will be added on a continuous basis, allowing a more regular flow and shorter publication times. The papers will appear in reverse order, therefore the most recent one will be on top.

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Volume 15, 2021

Title of the Paper: Adaptive Directional Cubic Convolution for Integrated Circuit Chip Defect Image Interpolation

Authors: Yuan Chao, Chengxia Ma, Wentao Shan, Junping Feng, Zhisheng Zhang

Pages: 1084-1090 

DOI: 10.46300/9106.2021.15.117     XML

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Abstract: An adaptive directional cubic convolution interpolation method for integrated circuit (IC) chip defect images is proposed in this paper, to meet the challenge of preserving edge and texture information. In the proposed method, Otsu thresholding technique is employed to distinguish strong edge pixels from weak ones and texture regions, and estimate the direction of strong edges, adaptively. Boundary pixels are pre-interpolated using the original bicubic interpolation method to help improve the interpolation accuracy of the interior pixels. The experimental results of both classic test images and IC chip defect images demonstrate that the proposed method outperforms the competing methods with better edge and texture preservation, interpolation quality, more natural visual effect of the interpolated images and reasonable computational time. The proposed method can provide high quality IC chip images for defect detection and has been successfully applied on practical vision inspection for IC chips